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POWDER DIFFRACTION

SCIE
POWDER DIFFRACTION
雜志名稱:粉末衍射
簡稱:POWDER DIFFR
期刊ISSN:0885-7156
大類研究方向:工程技術
影響因子:0.511
數(shù)據(jù)庫類型:SCIE
是否OA:No
出版地:UNITED STATES
年文章數(shù):97
小類研究方向:工程技術-材料科學:表征與測試
審稿速度:>12周,或約稿
平均錄用比例:容易

官方網(wǎng)站:http://www.icdd.com/products/journals.htm

投稿網(wǎng)址:http://www.icdd.com/websubmission/launch.html

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POWDER DIFFRACTION

英文簡介

ICDD’s quarterly, (and a special topical issue) international journal, Powder Diffraction, focuses on materials characterization employing X-ray powder diffraction and related techniques. With feature articles covering a wide range of applications, from mineral analysis to epitactic growth of thin films to advances in application software and hardware, this journal offers a wide range of practical applications. ICDD, in collaboration with the Denver X-ray Conference Organizing Committee, has increased services for the subscribers of Powder Diffraction and authors of Advances in X-ray Analysis. Beginning in 2006, ICDD offered a copy of the previous year’s edition of AXA to Powder Diffraction institutional subscribers who receive both print and on-line versions. This effectively doubles the number of articles annually available to Powder Diffraction subscribers and significantly increases the circulation for the authors in Advances in X-ray Analysis. Subject coverage includes: ?Techniques and procedures in X-ray powder diffractometry ?Advances in instrumentation ?Study of materials including organic materials, minerals, metals and thin film superconductors ?Publication of powder data on new materials Authors, subjects and page numbers are listed in the past issue content pages. Authors should read Notes for Authors for information on the scope, categories, manuscript preparation and submission to Powder Diffraction.

POWDER DIFFRACTION

中文簡介

ICDD的《季刊》(和一期特刊)國際期刊《粉末衍射》,著重于利用X射線粉末衍射和相關技術對材料進行表征。該雜志的專題文章涵蓋了廣泛的應用領域,從礦物分析到薄膜的外延生長,到應用軟件和硬件的進步,提供了廣泛的實際應用。ICDD與丹佛X射線會議組委會合作,為粉末衍射的訂戶和X射線分析進展的作者增加了服務。從2006年開始,ICDD向粉末衍射機構用戶提供了一份上一年版AXA的復印件,這些用戶可以同時獲得打印版和在線版。這有效地使粉末衍射用戶每年可獲得的文章數(shù)量翻了一番,并顯著增加了作者在X射線分析進展中的發(fā)行量。主題涵蓋:?X射線粉末衍射測量技術和程序?儀器進展?包括有機材料、礦物、金屬和薄膜超導體在內(nèi)的材料研究?關于新材料作者、主題和頁碼的粉末數(shù)據(jù)發(fā)布在上一期內(nèi)容頁中。作者應閱讀作者注釋,了解范圍、類別、手稿準備和提交粉末衍射的信息。

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